Electronic structure of crystalline polytypes and amorphous Si

Electronic structure and crystalline coherence in Fe/Si multilayers

Soft x-ray fluorescence spectroscopy has been used to examine the electronic structure of deeply buried silicide thin films that arise in Fe/Si multilayers. These systems exhibit antiferromagnetic (AF) coupling of the Fe layers, despite their lack of a noble metal spacer layer found in most GMR materials. Also, the degree of coupling is very dependent on preparation conditions, especially space...

Stability and crystallization of amorphous clusters in crystalline Si

We have simulated using molecular dynamics the thermal stability and crystallization kinetics of nanometre-sized clusters of amorphous Si embedded in crystalline Si, which are of interest for phase-change memory devices. We have calculated the interfacial and bulk excess energies of the amorphous clusters, and studied their crystallization kinetics at 700–1500 K. At temperatures below (above) 1...

Electronic Structure of Crystalline Materials

Electronic structure and bonding properties of Si-doped hydrogenated amorphous carbon films

This work investigates the C K-edge x-ray absorption near-edge structure (XANES), valence-band photoelectron spectroscopy (PES), and Fourier transform infrared (FTIR) spectra of Si-doped hydrogenated amorphous carbon films. The C K-edge XANES and valence-band PES spectra indicate that the sp2 /sp3 population ratio decreases as the amount of tetramethylsilane vapor precursor increases during dep...

Amorphous and Crystalline Silicon Films from Soluble Si-Si Network Polymers